Exam CTFL_Syll_4.0 Topic 1 Question 177 Discussion
Actual exam question for ISQI's CTFL_Syll_4.0 exam
Question #: 177
Topic #: 1
Question #: 177
Topic #: 1
The fact that defects are usually not evenly distributed among the various modules that make up a software application, but rather their distribution tend to reflect the Pareto principle:
Suggested Answer: C Vote an answer
The fact that defects are usually not evenly distributed among the various modules that make up a software application, but rather their distribution tend to reflect the Pareto principle, is expressed by the testing principle referred to as 'Defects cluster together'. This principle states that a small number of modules contain most of the defects detected, or that a small number of causes are responsible for most of the defects. This principle can be used to guide the test analysis and design activities, by prioritizing the testing of the most critical or risky modules, or by applying more rigorous test techniques to them. Therefore, option C is the correct answer.
ISTQBCertified Tester Foundation Level Syllabus v4.01, Section 1.2.1, page 11; ISTQBGlossary v4.
02, page 16.
ISTQBCertified Tester Foundation Level Syllabus v4.01, Section 1.2.1, page 11; ISTQBGlossary v4.
02, page 16.
by Sebastiane at Nov 25, 2025, 07:03 PM
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