Exam CTAL_TM_001 Topic 1 Question 144 Discussion

Actual exam question for ISTQB's CTAL_TM_001 exam
Question #: 144
Topic #: 1
You are a new lest manager in an organization You have been asked to assess the defect process to determine if there are any efficiency improvements that could be made that would reduce the cost of quality You have started digging through the defect Information What information would be most helpful for this investigation?

Suggested Answer: D Vote an answer

Key Data for Defect Process Improvement:
Analyzing when defects are introduced versus when they are detected is critical to identifying process inefficiencies.
This information helps pinpoint gaps in earlier phases, allowing the team to implement preventive measures and reduce overall costs.
Evaluation of Options:
A and B are useful but do not address the root cause of inefficiencies.
C (Risk areas and severity relationship) is helpful but secondary to understanding phase discrepancies.
D is correct as it provides the most actionable insights for process improvement.
Reference and Syllabus Alignment:
Defect lifecycle analysis is discussed under "Defect Management" (TM-2.3.1) in the ISTQB syllabus.

by Page at Nov 25, 2025, 01:38 AM

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